TBPS01 EMC Near-field Probes + TBWA2 Wideband Amplifier

Overview

The H20, H10, H5 and E5 are magnetic field (H) and electric field (E) probes for radiated emissions EMC pre-compliance measurements. The probes are used in the near field of sources of electromagnetic radiation.
They serve to locate and identify potential sources of interference within the building blocks of electronic assemblies.
The probes act similar as wide bandwidth antennas, picking up radiated emissions from components, PCB traces, housing openings or gaps and from any other parts that could be emitting RF. The probes are usually connected to a spectrum analyzer. Scanning the probe over the surface of  a PCB assembly or housing quickly identifies locations which emit electromagnetic radiation. By changing to a probe with smaller size, the origination of the emissions can be further narrowed down.
Additional applications are RF immunity tests by feeding a RF signal into the probe and radiating it into potentially susceptible circuit sections: Furthermore the probes can be used in the field of repair or debugging to track down issues in RF signal chains by contactless measurement of RF signal levels. One more application is non- invasive measurement of RF building blocks such as modulators or oscillators. Frequency, phase noise and spectral components can be measured in conjunction with a low noise preamplifier.
The TBWA2/20dB and TBWA2/40db wideband amplifiers are connected between EMC probe and Spectrum Analyzer to increase the dynamic range of the measurements.

TBPS01 Applications

Links and Reviews

EDN Review (EMC Blog from Kenneth Wyatt)

Elektronik Praxis EMC Pre Compliance Testing (in German)

The review starts at 27:22.

Example of using the near field probes for non-invasive RF measurement

EMI/EMC Testing: DSA815 w/ DIY Probes, TekBox Probes, TEM Cell

Another video from the EEV blog, starts are 19:10.

A review with our EMC probes and the Signalhound BB60C Spectrum Analyzer from the Signalpath, starts are 1:21.22.

Dave uses our H-Field probe to test a credit card RFID/NFC theft protection bag